A standard spectroscopic ellipsometer consists of several key components:
data to build a mathematical model of the material's structure. By adjusting parameters like thickness ( ) and optical constants ( Spectroscopic Ellipsometry
(Psi): The ratio of the amplitude change between two light components (parallel and perpendicular to the plane of incidence). Δcap delta (Delta): The phase difference between these two components. Spectroscopic Ellipsometry
Capable of observing the adsorption of protein monolayers onto surfaces in real-time. Spectroscopic Ellipsometry
A second rotating polarizer (and sometimes a compensator) that detects the change in the light's state.